X-ray Solution

  • 格物集成X射线吸收精细结构.jpg

    hiXAS

    integrated XAS solution        产品手册:产品手册.png


    lab-based turn-key EXAFS and XANES system synchrotron-quality spectra very high signal to noise ratio wide bandpass of up to 1keV
    hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data. Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary. The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges. Customized versions of hiXAS are available. For applications at lower energies, see proXAS. Please contact us to discuss your application.



    Elemental range



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    Range of elements accessible to hiXAS for EXAFS and XANES measurements. Even diluted samples with analyte concentrations of only a few weight percent can be measured in a time frame of several minutes.




    X-ray absorption measurement of a Cu foil Acquisition time: 3 min with sample 1.5 min without sample



    X-ray absorption spectrum of a 6um-thick Ni foil. Comparison to the spectrum obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000) shows the high quality results of the table-top instrument. All relevant spectral features are present, allowing for the determination of chemical compounds.



    Applications



    Chemical speciation and concentration ratios Compound research Short range order and bond length determination Catalyst analysis


  • proXAS-格物.jpg

    proXAS

    table-top NEXAFS system        产品手册:产品手册.png


    first integrated NEXAFS spectroscopy solution no need to apply for beamtime chemical state analysis for geology, biology, materials research synchrotron-quality spectra

    proXAS is the first system on the market to offer NEXAFS measurements in a laboratory. Fingerprinting for element analysis is now possible in-house with fast and accurate results. It combines a highly-reliable laser-based XUV source and a customized spectrometer with an extremely high resolving power of 1900. The energy range 200-1200eV allows for measurements at the K-edge of elements such as C, N, O, Ca, K, Ti. Customized versions of proXAS are available. For applications at higher energies, see hiXAS. Please contact us to discuss your application.



    Elemental range



    元素周期表.jpg
    The range of elements accessible to proXAS for NEXAFS measurements includes the K-absorption edges of C, N, O, F, as well as the L-edges of K, Ca, Ti, Cr, Mn, Fe, Co, Ni, Cu. Even diluted samples with analyte concentrations of only 0.2 wt% can be measured.



    Results



    1NEXAFS sample spectrum goethite-格物.jpg
    NEXAFS spectrum at the oxygen K-edge of the oxide minerals goethite, hematite, ferrihydrite, and CCa-2 chlorite. (1) measured with the table-top NEXAFS system, measurement time 5min (2) NEXAFS spectrum recorded at a synchrotron for comparison Peak positions deviate by less than 0.06% in energy, underlining the excellent agreement of proXAS measurements with synchrotron data.


    2NEXAFS sample spectrum carbon K-edge polyimide-格物3NEXAFS sample spectrum carbon K-edge polyimide-格物


    NEXAFS spectrum at the carbon K-edge of PMDA-ODA polyimide. (1) measured with the table-top NEXAFS system, measurement time 2.5min (2) NEXAFS spectrum recorded at a synchrotron for comparison All spectral features, corresponding to transitions of the benzene rings are clearly resolved.



    Applications



    Surface science Chemical state analysis in geochemistry Electronic structure and oxidation state analysis


2 products in total Add Contrast
Product Picture Product Model Drawings And Specifications Operation
Product Picture: Product Model:proXAS table-top NEXAFS system

chemical state analysis for geology, biology, materials research, synchrotron-quality spectra

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:hiXAS integrated XAS solution

synchrotron-quality spectra,very high signal to noise ratio

Drawings And Specifications: Operation:inquiry

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