Infrared Source

  •      Infrared light sources are a type of thermal radiation infrared source based on micro-electromechanical processing and electrical modulation technology. They possess the characteristics of blackbody radiation and have advantages such as low power consumption, high emissivity, and long service life. Our proprietary design is a resistive heating element deposited on a thin dielectric film, which is laid on a silicon structure fabricated by micro-electromechanical processing technology.

         The infrared light source is encapsulated in a compact TO package base. Additionally, structures with protective caps and reflective surfaces can be selected. These structures can be configured with low-pass filters made of materials such as sapphire, calcium fluoride, barium fluoride, germanium, etc.

         Goptica's infrared light sources are highly suitable for compact infrared gas detection modules that require extremely high emissivity, extremely high stability and low power consumption.


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    Infrared light source MEMS chipGoptica's infrared light sources can offer various packaging structures, reflective surfaces and low-pass filter options.



    Technical features

     · Characteristic blackbody radiation (2 to 14 μm)

     · High emissivity

     · Fast electrical modulation function (no chopper wheel required)

     · Extremely high modulation depth

     · The conversion efficiency of electrical energy into light radiation is high

     · Low power consumption

     · Long service life

     · Robust MEMS design (certified to IEC 60721-3-7 Class7M3, but excluding low-pass filters made of calcium fluoride and barium fluoride)



    Measurement principle

     · Non-dispersive infrared spectroscopy (NDIR)

     · Photoacoustic spectroscopy (PAS)

     · Attenuated total reflection (ATR) spectroscopy



    Target gas

    CO, CO2, VOC, NOX, NH3, SOX, SF6, hydrocarbons, humidity, anesthetic gas, refrigerant, breathing alcohol gas, etc



    Application

     · Medical care

       End-expiratory carbon dioxide chart, anesthetic gas detection, respiratory function monitoring, pulmonary function monitoring, respiratory alcohol gas detection, blood gas analysis

     · Industry

       Flammable and toxic gas detection, refrigerant monitoring, flame detection, fruit ripeness monitoring, SF6 monitoring, semiconductor manufacturing process.

     · Automobile

        CO2 vehicle refrigerant monitoring, alcohol detection and alcohol lock, in-vehicle air quality monitoring

     · Environment

        Heating, ventilation and air conditioning (HVAC), indoor air quality monitoring, and volatile organic compound (VOC) monitoring



    Technical advantage

     · It has the characteristics of real blackbody radiation (wavelength range: 2 μm to 14 μm)


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    Blackbody radiation spectrum

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    Microscope image: MEMES chip in TO39 package (left).
    The temperature distribution image of the film after heating (on the right).

    Radiation power of EMIRS 50 [mw/ μm]



    · High emissivity

      A unique thin-film process is used to produce a pure blackbody structure with an emissivity close to 1.


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    Emissivity diagram

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    Blackbody dendritic surface structure

    Wavelength[μm]



    · Fast electrical modulation function and extremely high modulation depth

      MEMS technology can produce thin and light films with extremely short thermal time constants, thereby enabling infrared light sources to have very high modulation frequencies and modulation depths


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    调制深度 VS 频率

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    Front and back photos of the infrared light source MEMS chip:

    EMIRS200 (left), EMIRS50 (right).

    Modulation frequency [HZ]

    When driving the light source with a constant voltage pulse, a high-speed broadband detector is used for detection



    · The conversion efficiency of electrical energy into light radiation is high

      Due to its blackbody characteristic surface, infrared light sources have an extremely excellent efficiency in converting electrical energy into light radiation. On the one hand, it benefits from the blackbody characteristic surface that can ensure the maximum emissivity; on the other hand, it comes from the optimized design of the radiative heat flow distribution of the film.


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    Optimize the conversion efficiency through the simulation experiment of radiant heat flow distribution



    · Reliable MEMS structure

      Semiconductor MEMS manufacturing technology ensures the quality and extremely high reliability of infrared light sources. In addition, a strict process control system at the wafer level ensures that each infrared light source undergoes final aging and testing.

    Life reliability curve

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    Time [hour]

    Infrared light source chips with MEMS process before cutting

         In the service life reliability test, the dotted line indicates that the infrared light source operates in pulse modulation mode. The modulation frequencies of EMIRS200 and EMIRS50 are 10Hz and 30Hz respectively, with duty cycles of 62.5% for both. Solid lines indicate CW mode

         The mean time to failure (MTTF) of infrared light source film damage is obtained through statistical analysis of data collected from years of reliability experiments. The possibility of film damage largely depends on the type of packaging, the size of the input electrical power and the working mode.




    The advantages of low-pass filters

    · Supplement to the detector filter

    · Eliminate background signal interference and improve the signal-to-noise rati

    · Protect infrared light sources in harsh usage environments

    · Prevent parasitic effects of sample gas (for installing very tight low-pass filters)


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    滤光片的光谱透射率

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    An infrared light source with a low-pass filterWavelength [μm]
    The transmittance curves of low-pass filters made of different materials



    Customer customized selection

    Gopticas provides custom light sources to meet the special application requirements of OEM customers. The packaging structure, reflective surface design and type of low-pass filter can be customized. For instance, the special design of the reflective surface can optimize the angular distribution of the radiated signal, thereby enhancing the optical signal.



    Customize the reflective surface structure

    · The distribution of radiation signals can be optimized through Zemax software simulation

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    辐射功率 VS 角度

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    The collimation effect of the reflective surface on the infrared radiation source along the axis
    (Red area: High radiation distribution area.) Blue: Low-radiation distribution area

    Angle[°]
    Radiation distribution maps of infrared light sources with standard protective caps and reflective surfaces at different angles



    Main measurement principle

    The principle of non-dispersive infrared spectroscopy (NDIR)

    Non-dispersive infrared spectroscopy requires a broadband infrared light source that covers the absorption wavelengths of various gases being measured. The specific wavelengths of these gases to be measured need to be selected through the corresponding narrowband filters. The intensity of the infrared radiation signal in the gas chamber will decrease with the absorption of gas, and the extent to which the infrared radiation signal decreases is proportional to the gas concentration in the sample chamber. Pyroelectric or thermopile detectors are typically used for the detection of infrared radiation signals.

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    The principle of photoacoustic spectroscopy (PAS)

    When infrared radiation energy is absorbed by the gas, the gas will be heated, leading to thermal diffusion and thereby increasing the pressure in the sample gas chamber. On the contrary, infrared radiation disappears and the gas cools, which leads to a decrease in pressure. Pressure fluctuations (such as sound waves) can be generated through modulated pulsed infrared light sources, which can then be detected by microacoustic sensors. The higher the concentration of the gas being measured, the stronger the signal (the wavelength of the gas being measured is selected through a narrowband filter). Photoacoustic spectroscopy (PAS) can be applied to gases, as well as solids and liquids.

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    The principle of attenuated total reflection (ATR)

         When radiation is total reflected at the interface, a small portion of it will be transmitted to the adjacent medium, forming an attenuated wave. This attenuation wave will decay exponentially with the penetration depth. The radiation intensity of the attenuated wave coupled to the interface depends on the refractive index difference between the two adjacent media. In the attenuated total reflection (ATR) method, a crystal made of a material with a high refractive index serves as a light-conducting medium. By coming into contact with the sample (usually a liquid), the attenuated wave interacts with it. Select the appropriate wavelength to pass through the corresponding narrowband filter.

         Depending on the state or quality of the sample, more or less light is coupled together, and the signal on the detector changes accordingly. Thermopile arrays or pyroelectric detectors are often applied in these devices.

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    Infrared light source Labki

    · The parameters of infrared light sources can be designed simply and quickly

    · A very effective tool for evaluating the ideal driving mode to achieve the best signal-to-noise ratio

    · It can be started up and measured simply and quickly within minutes

    · It includes all the technical parameters you can think of


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      User graphical interface(GUI)


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    The driver circuit board of the infrared light source Labkit

      


    · Based on LabVIEW software technology, it features a very simple user graphical interface (GUI)

    · Real-time setting and update of driver parameters

    · Real-time display of data and records through dynamic graphics

    · Visualization of Limitations in Drive Mode (Recommended)

    · It can output bitmap and Excel format data

    · The RS232 interface and USB interface are directly connected to the compute

    · Connect the infrared light source TO the socket or terminal block

    · The analog input/output signal interface can be used as the synchronization signal for the detector



    ParameterUnitNumerical valueTest conditions
      Drive mode
    P / V / IDc/Waveform model
      Power control PmW50 – 800Power regulation
      Voltage control VV0.5 – 10Voltage regulation
      Current control Ima5 – 100Current regulation
      Waveform signal
    Dc/Waveform signal
      FrequencyHz0 (CW), 4 – 50
      Duty cycle%5 – 90
      Analog input/output signalsV0 – 5The synchronous signal of the detector circuit records the detector signal





2 products in total Add Contrast
Product Picture Product Model Drawings And Specifications Operation
Product Picture: Product Model:Infrared Source:EMIRS200

EMIRS200

Drawings And Specifications: Operation:inquiry
Product Picture: Product Model:Infrared Source:EMIRS50

EMIRS50

Drawings And Specifications: Operation:inquiry

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