Your current location：Home> Product Information> Optoelectronic System>Film thickness measuring instrument>Small spot film measuring instrument and reflectance photometer

Small spot film measuring instrument and reflectance photometer

  •        Goptica small spot film measuring instrument and reflectance photometer are used for the rapid measurement of the surface optical reflectance, film thickness, and optical parameters (n&k) of sub-millimeter size devices (100 mm-500μm). The thickness of a single-layer film and the optical parameters of the material can be obtained simultaneously within 0.1 seconds. This instrument can be used in various environments, such as laboratories, factory production lines and real-time measurements in the field.小光斑.png

       

    Advantage
    		Application
    Small spot: The measured spot diameter ranges from 100 μm to 500 μm
    Fast speed measurement: The single-point measurement time is less than 0.1 seconds
    High precision: Reflectivity accuracy 0.3%, film thickness accuracy 0.2nm
    Wavelength range: 350nm to 1000nm, 1000nm to 1700nm
    Compact and portable: Weighs 2.5 kilograms, connects to a computer via USB, and the software is easy to learn and use
    		Optical coating: Measurement of anti-reflection coating, high reflection coating and beam splitting coating for lenses
    Medical devices: Measurement of reflectance of endoscope lenses, cohesive para-xylene protective layers, and surface coatings of medical devices
    Semiconductor manufacturing: silicon dioxide (SiO2), silicon nitride (SiN4), ITO(indium tin oxide), organic light-emitting layer, polyimide (PI), photoresist thickness measurement
    Solar cells: Measurement of silicon nitride anti-reflection film and aluminum oxide passivation layer



    Product parameters and manual

    Product manual：

    ParametersTechnical indicators
    Measurement contentReflectance, film thickness and optical constants(n&k)
    Spot size100 um,200 um, 300 um, 500 um
    Film thickness range15 nm to 100 μm, accuracy is 0.2 nm
    Measurement timeThe single-point measurement time is less than 0.1 seconds
    Spectral range350nm-1000nm，1000nm-1700nm
    Sample size1 mm-100 mm
    Instrument weight2.5kg
    Instrument dimensions29 x 23 x 22 cm
    Data processingUSB data transmission, with supporting software Spectra_Sensor and Film_Analyzer
    Operating systemWindows 10 and above systems
    Power supply100-240 VAC，50160 Hz，0.4 A


0 products in total Add Contrast
Product Picture Product Model Drawings And Specifications Operation

Please contact us for more information

  • Information request

  • Price consultation

  • Product delivery date

  • Product customization

  • Demo application

  • Sample application

  • Technical support

  • Other

Precautions and requirements for products Contact Us Inquire By Telephone
  1. Contact Us
  2. Precautions and requirements for products
  3. Inquire By Telephone

Copyright © 2021　 www.goptica.com copyright　沪ICP备2024066748号-1